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E hatches. The ROI integrated each uncoated PP also as
E hatches. The ROI integrated each uncoated PP at the same time as five of 18 single and double hatches. Surface temperature in the ROI was collected by an IR camera (Model Cedip-FLIR Titanium by FLIR Systems, T y, Sweden) with an InSb sensor possessing a NETD equal to 25 mK. This IR camera makes it possible for acquiring thermal photos at a a maximum of 160 Hz using a 25 mK. This IR camera allows acquiring thermal pictures at maximum of 160 Hz using a complete complete frame (320265265 pixels), and it reached Hz, reducing the window to 160to 160 128 frame (320 pixels), and it reached 472 472 Hz, lowering the window 128 IQP-0528 Technical Information pixels. pixels. Some preliminary allowed selecting this Streptonigrin Autophagy second option because the bestbest one particular to anSome preliminary tests tests allowed choosing this second option because the a single to analyze alyzesprayed coating pattern, along with the camera was placed at a distance in the panel, the the sprayed coating pattern, along with the camera was placed at a distance from the panel, resulting in aaspatial resolution of 0.1875 mm/pixel. Figure 1 1 schematizes the test setup. resulting in spatial resolution of 0.1875 mm/pixel. Figure schematizes the test setup. Temperatures at each and every pixel have been stored as aafunction of the time on a laptop, connected through Temperatures at each and every pixel have been stored as function on the time on a laptop, connected through an Ethernet cable with thecamera. Information storage was was performed with the computer software an Ethernet cable with the IR IR camera. Data storage performed together with the computer software Altair Altair by FLIR Systems (v.five.90.002, T y, Sweden); the occurred 0.two s soon after the starting of by FLIR Systems (v.5.90.002, T y, Sweden); the flash flash occurred 0.two s immediately after the beginning recording as well as the total recording time was 1.7 s. 1.7 s. the of the recording and the total recording time wasFigure 1. Schematics in the test setup. Figure 1. Schematics of your test setup.Following the thermal measurements, the panel was reduce having a vertical saw in corresponAfter the thermal measurements, the panel was reduce using a vertical saw in corresponddence with all the ROI to enable observations and measurements in the SEM (Model EVO ence together with the ROI to let observations and measurements at the SEM (Model EVO 50XVP by Zeiss, Oberkochen, Germany). The SEM was operated at a functioning voltage 50XVP by Zeiss, Oberkochen, Germany). The SEM was operated at a working voltage of of 20 kV together with a correct operating distance for any focused image working with the secondary 20 kV together with a correct operating distance for any focused image employing the secondary elecelectron (SE) detection. Two samples were extracted having a band saw, as shown in Figure 2: tron (SE) in betweenTwotwo samples correspondswith a bandof a horizontal hatch. S1 was the line detection. the samples were extracted towards the axis saw, as shown in Figure two: the line inside a through-thickness analysis along theto theof the hatch (decrease side), though S2 made use of for between the two samples corresponds axis axis of a horizontal hatch. S1 was applied for afor analyzing the surface and its coverage. on the hatchthe embeddedwhile S2 permitted through-thickness analysis along the axis The size of (decrease side), particles permitted for analyzing the SEM photos its terms of equivalent diameter applying theparticles was measured from these surface and in coverage. The size of the embedded application was measured from R2018a, MathWorks, Natick, MA, USA). Ultimately, to help the disMATLAB (version these SEM pictures in terms of equivalent diameter using the application MATLABthe SEM was also utilized to perf.

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Author: haoyuan2014